德***ZEISS蔡司聚焦離子束掃描電鏡FIB/SEM

在蔡司Crossbeam系列中,您可選擇Crossbeam 350或者Crossbeam 550,來滿足您急需的表征應用,您還可選擇不同的樣品倉尺寸從而更好的兼容您的樣品。
.png)
In the Zeiss Crossbeam series, you can choose Crossbeam 350 or Crossbeam 550 to meet your urgent need for characterization applications, and you can also choose a different sample chamber size for better compatibility with your samples.
Zeiss Crossbeam 350
Scanning electron beam system Gemini I cylinder
Variable pressure option
Sample bin size and interface the standard sample bin has 18 extension ports
The X/Y travel of the sample table is 100mm
Charge control charge neutralization gun
Local charge neutralizer
Variable pressure
Optional: Inlens SE and Inlens EsB* probes capture both SE and EsB imaging
VPSE detector
Features a wide range of sample compatibility due to the use of variable pressure mode, suitable for all kinds of in-situ experiments, which can obtain SE/EsB images in turn